1Jan

Nikon Inspection And Adjustment Program

1 Jan 2000admin

Nikon Metrology SEM supports pioneering ceramics applications, from cancer treatment to pump technologyA JCM-6000 NeoScope benchtop scanning electron microscope (SEM) from Nikon Metrology was recently installed at Morgan Advanced Materials’ Innovation Hub in the UK. It is a world-class facility combining technically advanced analytical equipment and development expertise to meet the technical challenges of the company’s customers.World-leading oncology supportA good example of the market-leading materials research being undertaken is the work on exciting new technologies such as ceramic injection moulding. Its complex forming capability has allowed Morgan to produce a commercially available, high precision ceramic tip for microwave ablation of tissues to remove tumours. Due to its micro design, patient trauma following surgery is significantly reduced.The extremely fine structure of the material imparts high strength and toughness, which are critical for the demanding application. Due to the material’s small grain size, its microstructure cannot be analysed using the company’s standard 50x optical microscope, so SEM techniques were required.Dr Tim Clipsham, Technical Manager, Morgan Advanced Materials, said, “The JCM-6000 was essential to enable our scientists to develop a material with advanced properties to suit this medical customer’s specification.“Previously, when our inspection requirements fell outside the capabilities of optical microscopy, we used to subcontract SEM analysis.

Maintenance of Nikon camera and lenses. What kills me about Nikon, is that if you need to call their tech support, you can wait a long long time (and listen to shitty canned music while on hold). The one occasion that I called, it took three attempts the afternoon, with a total of over 2 hours waiting time. Nikon Metrology’s Laser Radar. The Laser Radar provides a unique alternative to the shortcomings of the traditional inspection methods. The Laser Radar performs automated, highly accurate, contactless measurements by using a focused laser that is controlled by precision azimuth and elevation drives.

In recent years, the need for such analysis has steadily increased, making it critical to our on-going business activities to install this facility in house.“Having the benchtop SEM from Nikon Metrology on-site also allows us greater control over the equipment and the outcome from the analyses. Photo By: Nikon MetrologyOctober 30, 2013 – Brighton, MI – CMM-Manager is viewed as one of the most valued tactile inspection software programs for CNC and portable CMM’s in the industry. This task-oriented, highly intuitive software helps users more accurately complete projects in less time; resulting in increased productivity. To help companies improve their bottom line and broaden their knowledge of this program, Nikon is offering free CMM-Manager User Group technology events to its customers. As a result, companies across the nation are sending users to these free technology events to learn more about this multifaceted program, while increasing efficiency; thus broadening user knowledge, and raising ROI.“Nikon Metrology has always believed that owning a Nikon is more than purchasing a great product, it’s about becoming a part of a family that is focused on providing an enhanced imaging experience that will exceed your expectations,” said Marketing & Communications Manager Jeff Bourque. “By offering valuable, information-packed sessions to our CMM-Manager users, we are instilling confidence in our customers that our systems do what they say they do.”Many of the CMM-Manager users whom attended the CMM-Manager Users Group Seminar in Brighton, last Tuesday, October 22, agreed the skills learned during this seminar will be very beneficial in the near future.

Many said that the information they learned during this seminar will reduce inspection time and increase efficiency when using this powerful software. One attendee, James from a local metal fabricating company, found the seminar to be especially useful, stating “I’ve been to over 24 seminars in my career, and yours was the best I’ve been to. I found it very organized, and welcoming with a genuine concern for customers questions and business.” In response to receiving such a great response to their first CMM-Manager Users Group event, Nikon Metrology is planning to offer two more CMM-Manager Users Group Seminars over the next three months. The next CMM User Group Seminar will be held in Irving, TX this upcoming November.For more information on upcoming seminars in your area visit Nikon Metrology online at, or contact Kate Vander Meulen at 810-494-5614.Nikon Metrology, Inc. Offers the most complete and innovative metrology product portfolio, including state-of-the-art vision measuring instruments complemented with optical and mechanical 3D metrology solutions. These reliable and innovative metrology solutions respond to the advanced inspection requirements of manufacturers active in aerospace, electronics, automotive, medical, consumer and other industries. For more information on our products visit at, or follow our blog at and Facebook at.

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A calendar of events can also be found on our Web site at.# # #ABOUT NIKON METROLOGYNikon Metrology offers the most complete and innovative metrology product portfolio, including state-of-the-art vision measuring instruments complemented with optical inspection and mechanical 3D metrology solutions. These reliable and innovative products respond to the advanced inspection requirements of manufacturers active in consumer, automotive, aerospace, electronics, medical and other industries. For more information, visit.Product-related inquiries may be directed to Nikon Metrology, Inc. At 810-220-4314. Computerised inspection system for the energy sectorfinds applications analysing safety-critical concreteConwy Valley Systems (UK) has become a global leader in the supply of computerised photo-microscopy systems for inspection, statistical analysis and classification of rock samples to assist oil and gas exploration. Known generically as a digital petrography tool and marketed under the trade name, PETROG, the latest system is powered by a Nikon Eclipse 50 iPOL binocular microscope equipped with the Japanese firm’s DS-series digital camera, all supplied through Nikon Metrology in Castle Donington, Derbyshire.The advance in this branch of technology has been so profound that it has become almost essential for petrophysicists and remote sensing geophysicists to use it for calibrating and ground-truthing their otherwise largely relative, as opposed to absolute, measurements of rock structures. Companies in 44 countries use the system, the only significant markets yet to adopt it being China, Russia and Japan.The automated point-counting system is a much faster and more accurate alternative to visual microscopy accompanied by manual tick-box recording of results.

The user has a much better understanding of the rock sample, its constituent minerals, oil-bearing capacity and extraction potential. PETROG displays results almost immediately on the screen and has the added advantage of storing all photographic images for future re-analysis, if required.Another alternative way of testing rock is crushing analysis, which simply calculates the porosity of the sample and hence the amount of oil it could contain, but it gives no indication of how the holes were interconnected and thus how well oil would flow.The uniqueness of PETROG derives from the invention of a stepping stage which allows the polarising microscope stage to rotate automatically.

Unlike a conventional microscope on which the slide and stage are fixed, apparatus for looking at rock has to view light at different angles through a polarising filter. Only in this way it is possible to distinguish between different constituents such as feldspar, quartz and clay, hence the need to index the stage in known increments. The system is equally suited to studying samples illuminated episcopically (by reflected light) or diascopically (by transmitted light).A further application in the energy sector is the analysis of coal samples to assess the quality of a seam. It enables a mine to determine how to blend its output and where it should be sold. For instance, a steel mill is able to use information on the coal’s microstructure to calculate how long it will burn at blast furnace temperature, allowing the steelmaking process to be controlled and optimised.The construction industry also benefits from PETROG, since a sample of man-made concrete can be analysed as easily as natural rock. It is an important new target market for Conwy Valley Systems. A recent success was the purchase by CEDEX, a Spanish government research agency in Madrid, of the digital petrography tool for monitoring the integrity of civil engineering structures in Spain’s built environment, including critical structures such as dams, looking for early warning signs of failure in the concrete structure.The first application in this sector dates back to 2004, when a PETROG system was installed in Cornwall, UK, to support mortgage providers by checking for a specific impurity in locally made concrete that can potentially cause cracking.

The so-called mundic tests are needed because, before 1950, houses in the South West of England were often built with concrete block containing aggregate consisting of copper or lead mine waste which in turn contains sulphides that can oxidise and accelerate degradation. The PETROG installation, at Petrolab in Redruth, was an early example of a system fitted with a digital camera (model DXM1200) from Nikon Metrology. Other manufacturers’ digital cameras and microscopes can be similarly utilised, according to customer preference.Conwy Valley Systems, which won The Queen’s Awards for Enterprise in the Innovation category in 2011, offers its petrography system with or without a microscope, according to whether one exists at a user’s premises. It is assumed that a computer is available, although one can be provided. Key to the company’s service are the supply and fitting of the stepping stage to the microscope, the digital camera and PETROG software. The latter is available in various versions to interface with different digital cameras’ low-level control software so that images can be captured remotely and embedded for petrographical analysis. Eight man-weeks of programming by Conwy Valley Systems are typically required to achieve this level of integration.The Nikon Eclipse 50 iPOL polarising microscope is a compact desktop model with up to five centerable objectives ranging from 4x to 100x mounted to the nosepiece.

The bright, 30 Watt halogen light source consumes little power and so generates minimal heat, reducing the chance of temperature-induced focus drift. More details are available at:The company’s Digital Sight DS-Fi2 camera used in this microscopy application has a configurable head, a high-definition 5-megapixel sensor and a newly developed CCD control circuit offering a fast frame rate of 21 per second. A digital video camera is recommended for use with PETROG, rather than a still camera, as the faster response reduces waiting time for the image to catch up when refocussing, rotating the stage or changing filters. Further details are at:The PC-to-camera control unit, DS-U3, uses a high-speed IEEE1394b (FireWire 800) serial bus interface, enabling rapid capture, management, processing and analysis of images. Further details are at.

Visit Booth #98!Learn about the latest and greatest in (CT) technology when you Visit Nikon’s booth at the upcoming ECTC Conference in Las Vegas on May 28-31st. Hope to see you there!About ECTC:The premier international packaging, components, and microelectronics systems technology conference, the strives to offer our attendees an outstanding array of packaging technology information. This year’s conference will have about 40 technical sessions (oral presentations, interactive presentations, and student posters), 16 professional development courses, a panel discussion, a plenary session, a CPMT Seminar, and a technology corner for exhibitors. The 63rd ECTC will be held at the Cosmopolitan of Las Vegas, Las Vegas, Nevada, USA from May 28 – May 31, 2013.Source: www.ectc.net. CONTROL 2013, the international trade fair for quality assurance will be the venue for releasing new inspection solutions within the extended Nikon Metrology product portfolio. With the introduction of the MCT225 HA, Nikon Metrology provides high accuracy Metrology CT for a wide range of sample sizes and material densities. In the field of CMM inspection, Nikon Metrology presents the ALTERA ceramic bridge CMM with multi-sensor CAMIO software.

Another breakthrough is the NEXIV VMZ-R4540, a next-generation CNC Video Measuring System. Another reason to visit the Nikon Metrology booth is the premium range of microscopy solutions, including the brand new SMZ 25 & SMZ 18 and the BW-S50x surface profiler featuring picometer height resolution.Absolute accuracy for Metrology-CTThe new MCT225 HA combines more than 95 years of Nikon experience in optical metrology, 50 years of LK experience in CMM metrology and 25 years of X-Tek experience in Computed Tomography (CT). MCT225 HA – the most accurate in its class – provides high accuracy Metrology CT for a wide range of sample sizes and material densities with 3.8+ L/50 µm MPE l accuracy in accordance with the VDI/VDE 2630 guideline. All internal and external geometry is measured efficiently in a single non-destructive process. A full 3D visualization of the sample volume additionally provides valuable insights into part deformations and internal structural integrity.Multi-sensor ALTERA CMM for best-in-class combination of productivity and flexibilityThe new ALTERA range of bridge coordinate measuring machines (CMMs) have been developed to meet the varying needs of manufacturers, both today and in the future.

Improved productivity, enhanced metrology and greater flexibility are the hallmarks of this new generation of premium quality CMMs from Nikon Metrology, notably the first from Nikon Metrology with the Nikon insignia. Combined CAMIO and a wide range of tactile and optical sensor, this range of highly accurate CMMs truly supports multi-sensor measuring applications.NEXIV VMZ-R4540 CNC Video Measuring SystemThis next-generation NEXIV system aims at fast and accurate measurement of the dimensions and shapes of high density and multi-layered electronic components.In recent years, accurate measurements of advanced products (i.e. Smartphones and tablets) and high-speed image processing technology for mass production have become a standard inspection operation.Utilizing optical measuring technology and image processing, the CNC Video Measuring System automatically measures the dimensions and shapes of electronic components.SMZ 25 & 18 high-end stereoscopic microscope – A giant leap forward in microscopyThe SMZ 25 and 18 are revolutionizing stereomicroscopy with their unique zoom range, along with modularity, comfort and ultra-high-performance optics. These new SMZ cover a wide range of functionality, from basic stereoscopic images of unparalled quality to the most sophisticated observation. An innovative optical system known as “Perfect Zoom Optics” provides the world’s first zoom ratio of 25:1. Even with a 1x objective lens, the SMZ25 captures the entire 35mm dish and simultaneously delivers microscopic details.BW-S50X provides ultra-high vertical resolution of 1 picometerBW-S50X series measure surface profiles from sub-nano to millimeter height ranges speedily and accurately.

BW series are available with optical microscope such as LV150N, MM800, L300N, CM10. Nikon Corporation (Makoto Kimura, President; Chiyoda-Ku, Tokyo,) is pleased to announce the introduction of our newest Research Stereo Microscopes SMZ25/SMZ18, featuring “the largest zoom range” 1, “extremely high resolution” and “exceptionally bright Epi-fluorescence”.Product informationProduct name: Research Stereo Microscope SMZ25 / SMZ18Brochure:LEARN MORE:The SMZ25/SMZ18 is ideally suited for both industrial tasks as well as bioscience and medical applications. The extremely large zoom range and high resolution allows users to image the sample from its entirety down to its microscopic details.Image of a watch using the 1x objective lens with SMZ25.

. NEF (RAW): 12 or 14 bit, lossless compressed, compressed or uncompressed; small size available (12-bit uncompressed only). TIFF (RGB). JPEG: JPEG-Baseline compliant with fine (approx.

1:4), normal (approx. 1:8) or basic (approx. Matrix: 3D color matrix metering III (type G, E and D lenses); color matrix metering III (other CPU lenses); color matrix metering available with non-CPU lenses if user provides lens data. Center-weighted: Weight of approx. 75% given to 12-mm circle in center of frame; diameter of circle can be changed to 8, 15 or 20 mm, or weighting can be based on average of entire frame (non-CPU lenses use 12-mm circle). Spot: Meters 4-mm circle (about 1.5% of frame) centered on selected focus point (on center focus point when non-CPU lens is used). Highlight-weighted: Available with type G, E and D lenses (equivalent to center-weighted when other lenses are used)Range(ISO 100, f/1.4 lens, 20°C/68°F).

Autofocus (AF): Single-servo AF (AF-S); continuous-servo AF (AF-C); predictive focus tracking automatically activated according to subject status. Manual focus (M): Electronic rangefinder can be usedFocus pointCan be selected from 51 or 11 focus pointsAF-area modeSingle-point AF, 9-, 21- or 51-point dynamic-area AF, 3D-tracking, group-area AF, auto-area AFFocus lockFocus can be locked by pressing shutter-release button halfway (single-servo AF) or by pressing AE-L/AF-L buttonFlashBuilt-in flashManual pop-up with button release and a guide number of approx. Exposure modes P, S and A: Auto ISO sensitivity control (ISO 64 to Hi 2) with selectable upper limit. Exposure mode M: Auto ISO sensitivity control (ISO 64 to Hi 2) available with selectable upper limit; manual selection (ISO 64 to 12800 in steps of 1/3, 1/2 or 1 EV); can also be set to approx. 0.3, 0.5, 0.7, 1 or 2 EV (ISO 51200 equivalent) above ISO 12800Other movie optionsIndex marking, time-lapse photographyMonitorMonitor8-cm/3.2-in., approx. 1229 k-dot (VGA; 640 x RGBW x 480 = 1,228,800 dots) TFT monitor with 170 ° viewing angle, approx.